Citation:
Mor Tzur, Desiatov, Boris , Goykhman, Ilya , Grajower, Meir , and Levy, Uriel . 2013. “High Resolution Direct Measurement Of Temperature Distribution In Silicon Nanophotonics Devices”. Optics Express, 21, 24, Pp. 29195-29204. https://www.osapublishing.org/oe/abstract.cfm?uri=oe-21-24-29195.
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