Citation:
Yoel Sebbag, Goykhman, Ilya , Desiatov, Boris , Nachmias, T. , Yoshaei, O. , Kabla, M. , Meltzer, S. E. , and Levy, Uriel . 2012. “Bistability In Silicon Microring Resonator Based On Strain Induced By A Piezoelectric Lead Zirconate Titanate Thin Film”. Applied Physics Letters, 100, 14, Pp. 141107. https://aip.scitation.org/doi/10.1063/1.3701587.
![Bistability in silicon microring resonator based on strain induced by a piezoelectric lead zirconate titanate thin film Bistability in silicon microring resonator based on strain induced by a piezoelectric lead zirconate titanate thin film](https://uriellevy.huji.ac.il/sites/default/files/styles/book_cover/public/uriellevy/files/bistability_in_silicon_microring_resonator_based_on_strain_induced_by_a_piezoelectric_lead_zirconate_titanate_thin_film.png?m=1667757685&itok=wa_We_CV)