Citation:
Eitan Edrei, Cohen, Niv , Gerstel, Elam , Gamzu-Letova, Shani , Mazurski, Noa , and Levy, Uriel . 2022. “Chip-Scale Atomic Wave-Meter Enabled By Machine Learning”. Science Advances, 8, 15, Pp. eabn3391. https://doi.org/10.1126/sciadv.abn3391.
sciadv.abn3391_01.pdf | 1.22 MB |